Module & Tray Versions; 760 to 1650 nm; Insertion Loss 0.7 to 1.2 dB; Return Loss 25 to 62 dB; max. Crosstalk -55, -60, -80 dB; Max. Input Power 300 mW

Manufacturing test automation is critical to reducing product costs and optical switches are at the heart of any automated test system. Viavi Solutions’ mOSW-C1 MAP series of optical switch modules and mISW-C1 MAP series of optical switch trays are built on the industry-leading, fourth-generation instrumentation class of Viavi Solutions optical switch technology. With more than 30 years of leadership in optical switching across network, monitoring, and manufacturing applications, the mOSW-C1/mISW-C1 MAP series represents a new milestone for performance and reliability with the industry’s smallest footprint.

For the first time, the performance and repeatability found in large, fixed format 19-inch Viavi Solutions rack-mount systems are available in a modular plug-in or tray. Manufacturing engineers no longer have to choose between test system’s size and its performance. Leveraging the mOSW-C1/mISW-C1 MAP series can reduce the size of switching systems by as much as 75% while still delivering the performance of much larger legacy systems. A 50% increase in switching speeds significantly saves testing time for connection-intensive architectures.

These switches are components of the MAP-300 (and legacy MAP-200) family. With the widest range of optical modules in the industry, it is the most popular choice for manufacturing test automation across all optical industry segments. This includes the manufacture of passive components, transponders, and line cards. Advanced connectivity through remote VNC, Ethernet, GPIB, or local GUI makes the MAP-300 a natural choice for complex automation architectures because it dramatically simplifies debugging for remotely located manufacturing sites.

Key Features:

• Provides All Optical Switching, Independently From Data Rate and Transmission Format
• Minimal Impact on Dynamic Measurement Range Regardless of Switch Size
• Low Loss for All Configurations from 1x2 to 1x176
• Flexible SCPI Remote Interface
• Ultra-low 0.04 dB PDL and ±0.005 dB Repeatability
• New PTRIM Option Simplifies Troubleshooting and Measures In-line Power up to 20 dB- 1C, 2D (Duplex), and 2E Input Configurations
• Expanded Beam Technology Ensures Multi Mode Switches Are “Modally Transparent”

Applications: Test System Automation for Multi-port Components, Modules and Line Cards; Management of Complex Test Sequencing in Manufacturing; Test of Multi-fiber Connectors (Paired With mORL-A1); Test for Long-term Reliability

Module & Tray Versions; 760 to 1650 nm; Insertion Loss 0.7 to 1.2 dB; Return Loss 25 to 62 dB; max. Crosstalk -55, -60, -80 dB; Max. Input Power 300 mW

Manufacturing test automation is critical to reducing product costs and optical switches are at the heart of any automated test system. Viavi Solutions’ mOSW-C1 MAP series of optical switch modules and mISW-C1 MAP series of optical switch trays are built on the industry-leading, fourth-generation instrumentation class of Viavi Solutions optical switch technology. With more than 30 years of leadership in optical switching across network, monitoring, and manufacturing applications, the mOSW-C1/mISW-C1 MAP series represents a new milestone for performance and reliability with the industry’s smallest footprint.

For the first time, the performance and repeatability found in large, fixed format 19-inch Viavi Solutions rack-mount systems are available in a modular plug-in or tray. Manufacturing engineers no longer have to choose between test system’s size and its performance. Leveraging the mOSW-C1/mISW-C1 MAP series can reduce the size of switching systems by as much as 75% while still delivering the performance of much larger legacy systems. A 50% increase in switching speeds significantly saves testing time for connection-intensive architectures.

These switches are components of the MAP-300 (and legacy MAP-200) family. With the widest range of optical modules in the industry, it is the most popular choice for manufacturing test automation across all optical industry segments. This includes the manufacture of passive components, transponders, and line cards. Advanced connectivity through remote VNC, Ethernet, GPIB, or local GUI makes the MAP-300 a natural choice for complex automation architectures because it dramatically simplifies debugging for remotely located manufacturing sites.

Key Features:

• Provides All Optical Switching, Independently From Data Rate and Transmission Format
• Minimal Impact on Dynamic Measurement Range Regardless of Switch Size
• Low Loss for All Configurations from 1x2 to 1x176
• Flexible SCPI Remote Interface
• Ultra-low 0.04 dB PDL and ±0.005 dB Repeatability
• New PTRIM Option Simplifies Troubleshooting and Measures In-line Power up to 20 dB- 1C, 2D (Duplex), and 2E Input Configurations
• Expanded Beam Technology Ensures Multi Mode Switches Are “Modally Transparent”

Applications: Test System Automation for Multi-port Components, Modules and Line Cards; Management of Complex Test Sequencing in Manufacturing; Test of Multi-fiber Connectors (Paired With mORL-A1); Test for Long-term Reliability