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SaleKeithley 2510 Keithley 2510 Precision Temperature Control Source Meter

Views:2503

Product parameters

Option Calibrated Delivery cycle Warranty Condition
No 0days 12month 80% new
Location Serial Number State Data download
Shenzhen City Intact
Budget Price: TEL
Update date:2020-03-18
Contact phone:+86-755-86016691

*Product description

product Description:
Keithley precision temperature control source meter of 2510 Keithley in the United States enhances the integrity of Keithley's high-speed LIV (light intensity-current-voltage) characteristic test of laser diodes. These two 50W power bipolar source meter instruments are specially designed for laser diode module test applications in optical communication networks to ensure strict temperature control of the device under test. Keithley 2510 precision temperature control source meter is the first temperature control instrument specially created for laser diode testing of optical communications. It combines Keithley's high-speed DC power supply and precision measurement capabilities to form a laser diode module. The thermoelectric cooler is a TEC capable of precise temperature control. Keithley 2510 precision temperature control source meter from the United States has extended the performance of the 2510 through the automatic tuning function. By using the improved Zeigler-Nichols algorithm, the instrument can obtain P, I, D (proportional, integral, and differential) values for closed-loop temperature control. Therefore, users do not need to judge the zui figure of merit of these coefficients through experiments. In other respects, the 2510 and 2510-AT have essentially the same functionality.


Features:

  • 50W TEC controller with DC measurement
  • Provide full digital PID control
  • Temperature control during laser diode module testing
  • Wide temperature setting (-50°C to +225°C), high resolution setting (±0.001°C), good stability (±0.005°C)
  • Supports multiple temperature sensor inputs - thermistor, RTD and IC sensor
  • Maintain constant temperature, current, voltage and sensor impedance
  • AC ohm measurement method to detect mechanical damage of TEC
  • TEC parameters are measured and displayed while temperature is being controlled
  • Four-wire open/short conduction detection for thermal feedback components
  • IEEE-488 and RS-232 interface
  • Compact half-rack design

Detailed information

product Description:
Keithley precision temperature control source meter of 2510 Keithley in the United States enhances the integrity of Keithley's high-speed LIV (light intensity-current-voltage) characteristic test of laser diodes. These two 50W power bipolar source meter instruments are specially designed for laser diode module test applications in optical communication networks to ensure strict temperature control of the device under test. Keithley 2510 precision temperature control source meter is the first temperature control instrument specially created for laser diode testing of optical communications. It combines Keithley's high-speed DC power supply and precision measurement capabilities to form a laser diode module. The thermoelectric cooler is a TEC capable of precise temperature control. Keithley 2510 precision temperature control source meter from the United States has extended the performance of the 2510 through the automatic tuning function. By using the improved Zeigler-Nichols algorithm, the instrument can obtain P, I, D (proportional, integral, and differential) values for closed-loop temperature control. Therefore, users do not need to judge the zui figure of merit of these coefficients through experiments. In other respects, the 2510 and 2510-AT have essentially the same functionality.


Features:

  • 50W TEC controller with DC measurement
  • Provide full digital PID control
  • Temperature control during laser diode module testing
  • Wide temperature setting (-50°C to +225°C), high resolution setting (±0.001°C), good stability (±0.005°C)
  • Supports multiple temperature sensor inputs - thermistor, RTD and IC sensor
  • Maintain constant temperature, current, voltage and sensor impedance
  • AC ohm measurement method to detect mechanical damage of TEC
  • TEC parameters are measured and displayed while temperature is being controlled
  • Four-wire open/short conduction detection for thermal feedback components
  • IEEE-488 and RS-232 interface
  • Compact half-rack design

Industry classification

1070431,1070439,1070441,1070435,1070434,1070437,1070436,1070479,1070481,1070480,1070475,1070442,1070474,1070476,

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