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Rent  /Optical communication/Error detector/bit error rate analyzer

RentAnritsu MP2100A Anritsu MP2100A Bit Error Rate Tester

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Master Chen import, quality assurance, fast delivery

Product Parameter

Option State Equipment value Whether measure
Intact 0 No
Condition Delivery cycle Seat of
80% new -- Shenzhen City
Budget Price： TEL

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Update date：2022-08-10
Contact phone：0755-86016691

* Product description

Product Description：

The MP2100A is an all-in-one BERT and Eye/Pulse Scope solution for evaluating optical active devices in optical communication systems.


To meet the need for the fastest possible measurement speeds on production lines for active optical devices, the Gating Time has been slashed by 90% compared to conventional BERT equipment using remote commands and the Eye/Pulse Scope function is 300% faster. In addition, measurement times are much shorter due to the simultaneous BER measurement and Eye pattern analysis.


The MX210001A Jitter Analysis Software has a new, high-speed, jitter-measurement function supporting all-in-one measurements, such as simultaneous jitter analysis, and Eye pattern measurement and Eye mask test measurements. Moreover, the high-speed sampling increases measurement efficiency by cutting measurement time. And Combining the MX210001A with MATLAB® supports WDP, TWDP and dWDP measurements for evaluating the waveform dispersion of specific signals.


Adding the MX210002A Transmission Analysis Software to the BERTWave supports Tx analyses (S21 Gain, Phase), and waveform simulation (de-embedded) using linear equalizer, filter, and emphasis operations; simultaneous waveform sampling and simulation support simultaneous Eye pattern measurement and Eye mask test measurements. Furthermore, combined tracking with the MX210001A software permits simultaneous post-simulation waveform jitter measurement.


Features：

  • All-in-one BER and Eye Pattern Measurements
  • High-speed Remote Tests
  • Supports Electrical and Optical Interfaces
  • High-speed Mask Tests
  • Easy Operability, Flash Disk Drive, and Eco-friendly
  • All-in-one unit supporting simultaneous Jitter, Eye Pattern and Eye Mask measurements
  • Supports all WDP measurements
  • Simultaneous sampling and ideal Equalizer/Emphasis value calculation with Eye display
  • Simultaneous Eye Pattern, Eye Mask and Jitter Measurements for simulation waveform

More>>

detailed information

Product Description：

The MP2100A is an all-in-one BERT and Eye/Pulse Scope solution for evaluating optical active devices in optical communication systems.


To meet the need for the fastest possible measurement speeds on production lines for active optical devices, the Gating Time has been slashed by 90% compared to conventional BERT equipment using remote commands and the Eye/Pulse Scope function is 300% faster. In addition, measurement times are much shorter due to the simultaneous BER measurement and Eye pattern analysis.


The MX210001A Jitter Analysis Software has a new, high-speed, jitter-measurement function supporting all-in-one measurements, such as simultaneous jitter analysis, and Eye pattern measurement and Eye mask test measurements. Moreover, the high-speed sampling increases measurement efficiency by cutting measurement time. And Combining the MX210001A with MATLAB® supports WDP, TWDP and dWDP measurements for evaluating the waveform dispersion of specific signals.


Adding the MX210002A Transmission Analysis Software to the BERTWave supports Tx analyses (S21 Gain, Phase), and waveform simulation (de-embedded) using linear equalizer, filter, and emphasis operations; simultaneous waveform sampling and simulation support simultaneous Eye pattern measurement and Eye mask test measurements. Furthermore, combined tracking with the MX210001A software permits simultaneous post-simulation waveform jitter measurement.


Features：

  • All-in-one BER and Eye Pattern Measurements
  • High-speed Remote Tests
  • Supports Electrical and Optical Interfaces
  • High-speed Mask Tests
  • Easy Operability, Flash Disk Drive, and Eco-friendly
  • All-in-one unit supporting simultaneous Jitter, Eye Pattern and Eye Mask measurements
  • Supports all WDP measurements
  • Simultaneous sampling and ideal Equalizer/Emphasis value calculation with Eye display
  • Simultaneous Eye Pattern, Eye Mask and Jitter Measurements for simulation waveform

More>>

Industry classification

1070414,1070415,1070416,1070417,1070418,1070419,1070420,1070587,1070470,1070563,1070477,1070504

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