Product Description

The Anritsu MP1800A is a modular, plug-in Bit Error Rate Tester (BERT) designed for cost-efficient and flexible BER testing. It supports physical layer testing for optical modules and high-speed devices up to 64.2 Gbit/s. The device integrates various functional modules, including a Pulse Pattern Generator (PPG), an Error Detector (ED), and a Jitter Modulation Source (JMS), providing high-quality signal generation and analysis capabilities.

Key Features

• Modular Design: The MP1800A is composed of modular components such as PPG, ED, and JMS modules, allowing for flexible expansion and upgrades .
• Wide Bandwidth Support: Supports bit rates from 0.1 Gbit/s to 32.1 Gbit/s, with PAM signals up to 64.2 Gbaud .
• High Input Sensitivity: The 28/32 Gbit/s ED module offers world-leading Rx sensitivity and fast auto-adjustment .
• Low-Jitter Waveforms: PPG modules provide low-jitter and high-amplitude waveforms, suitable for high-speed serial transmission testing .
• Multi-Channel Synchronization: Supports up to 8 channels for simultaneous measurements, ideal for parallel testing of multi-channel modules .
• Passive Equalizer: Enhances the eye opening in high-speed serial transmission, improving signal integrity .
• Clock Recovery: Supports stress jitter tolerance tests and BER measurements, essential for evaluating high-speed interfaces .
• Jitter Generation: Generates SJ, RJ, BUJ, SSC, and F/2 jitter for comprehensive jitter testing .
• PAM4/PAM8 Signal Generation: Supports high-quality PAM4 and PAM8 signal generation, suitable for R&D applications .
• True BER Measurement: Uses long-memory programmable patterns and error mask functions to achieve accurate PAM4 signal BER measurement .
• Application Range: Suitable for EA/EML module evaluation, 25G/100G PON OLT module inspection, and various high-speed device evaluations .

Product Description

The Anritsu MP1800A is a modular, plug-in Bit Error Rate Tester (BERT) designed for cost-efficient and flexible BER testing. It supports physical layer testing for optical modules and high-speed devices up to 64.2 Gbit/s. The device integrates various functional modules, including a Pulse Pattern Generator (PPG), an Error Detector (ED), and a Jitter Modulation Source (JMS), providing high-quality signal generation and analysis capabilities.

Key Features

• Modular Design: The MP1800A is composed of modular components such as PPG, ED, and JMS modules, allowing for flexible expansion and upgrades .
• Wide Bandwidth Support: Supports bit rates from 0.1 Gbit/s to 32.1 Gbit/s, with PAM signals up to 64.2 Gbaud .
• High Input Sensitivity: The 28/32 Gbit/s ED module offers world-leading Rx sensitivity and fast auto-adjustment .
• Low-Jitter Waveforms: PPG modules provide low-jitter and high-amplitude waveforms, suitable for high-speed serial transmission testing .
• Multi-Channel Synchronization: Supports up to 8 channels for simultaneous measurements, ideal for parallel testing of multi-channel modules .
• Passive Equalizer: Enhances the eye opening in high-speed serial transmission, improving signal integrity .
• Clock Recovery: Supports stress jitter tolerance tests and BER measurements, essential for evaluating high-speed interfaces .
• Jitter Generation: Generates SJ, RJ, BUJ, SSC, and F/2 jitter for comprehensive jitter testing .
• PAM4/PAM8 Signal Generation: Supports high-quality PAM4 and PAM8 signal generation, suitable for R&D applications .
• True BER Measurement: Uses long-memory programmable patterns and error mask functions to achieve accurate PAM4 signal BER measurement .
• Application Range: Suitable for EA/EML module evaluation, 25G/100G PON OLT module inspection, and various high-speed device evaluations .

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