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| Option | Warranty | State | Metering |
|---|---|---|---|
| days | Intact | No | |
| Condition | Cycle | Address | Number |
| QualityStatus.used | -- | Shenzhen City | 1 |
The SR250 Gated Integrator is a versatile, high-speed NIM module designed to recover fast analog signals from noisy backgrounds. The SR250 consists of a gate generator, a fast gated integrator, and exponential averaging circuits. Internally or externally triggered gate generators provide adjustable delays from a few nanoseconds to 100 ms, and then generate continuously adjustable gates with widths between 2 ns and 15 μs. The gate delay can be set from the front panel or can be automatically scanned by applying the rear panel control voltage. The scan threshold can recover the entire waveform.
The fast gated integrator integrates the input signal during the threshold period. The output of the integrator is then normalized through the gate width to provide a voltage proportional to the average value of the input signal during the sampling gate. This signal is further amplified and sampled by a low-voltage drop sampling hold amplifier and output through a front panel BNC connector. The final sample output provides a case-by-case analysis of the signal, making the instrument a particularly useful component in a computer data acquisition system.
trigger
The SR250 can be triggered internally or externally. The internal rate generator is continuously variable in the range of 0.5 Hz to 20 kHz with a range of 9. External trigger pulses can be as short as 5 ns, allowing the device to be triggered using fast pulses from photodiodes and photomultiplier tubes. Single and line triggers are also available.
Signal input
The sensitivity of the instrument (output voltage/input voltage) can be set from 1 V/1 V to 1 V/5 mV. If additional gain is required, the SR250 can be used with the SR240 preamplifier. The input is protected by 100 V and has an input impedance of 1 MΩ. The input filter is not required to reject the input before the integrator samples it
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