For the first time, the performance and repeatability found in large fixed-format 19-inch VIAVI rack-mount systems can be achieved in a modular plug-in or switch box. Manufacturing engineers no longer have to choose between test system size and system performance. Using mOSW-C1/mISW-C1 can reduce the size of switching systems by up to 75% while achieving the performance of much larger conventional systems. Switching speed was increased by 50%, significantly saving testing time for connection-intensive architectures.

These switches are MAP-200 series modular cards. It has the widest range of optical modules in the industry and is the most popular choice for manufacturing test automation in all optical industry segments. This includes the manufacture of passive components, transceivers and circuit boards. The MAP-200 is a natural choice for complex automation architectures because it significantly simplifies debugging of remote manufacturing sites by enabling advanced connectivity via remote VNC, Ethernet, GPIB, or a native GUI.

Features:

• All optical switches are available (independent of data rate and transmission format)
• Regardless of the switch size, the impact on the system's dynamic measurement range is minimized, with low losses for all configurations from 1x2 to 1x176
• The flexible SCPI remote interface enables users to program switches using MAP-200 style commands or maintain backward compatibility with the industry standard VIAVI SB/SC family of optical switches
• Ensures ultra-low 0.04dB PDL and ± 0.005dB repeatability, minimizes measurement uncertainty on single-input versions
• The new PTRIM option simplifies troubleshooting and can measure programmable rough losses of up to 20 dB of inline power on connected ports
• The 1C, 2D (duplex), and 2E input configurations implement a cost-saving architecture that reduces the number of switches required
• The expanded beam technology ensures that the multimode switch is "formally transparent" and does not interfere with the mode distribution, greatly simplifying transmission tests or tests with IEC standard mode startup

Application:

• Automation of test systems for multi-port components, modules and circuit boards
• Manage complex test sequence in manufacturing
• Used in conjunction with the MAP-200 mORL-A1 module to test multi-core connectors
• Long term reliability test

For the first time, the performance and repeatability found in large fixed-format 19-inch VIAVI rack-mount systems can be achieved in a modular plug-in or switch box. Manufacturing engineers no longer have to choose between test system size and system performance. Using mOSW-C1/mISW-C1 can reduce the size of switching systems by up to 75% while achieving the performance of much larger conventional systems. Switching speed was increased by 50%, significantly saving testing time for connection-intensive architectures.

These switches are MAP-200 series modular cards. It has the widest range of optical modules in the industry and is the most popular choice for manufacturing test automation in all optical industry segments. This includes the manufacture of passive components, transceivers and circuit boards. The MAP-200 is a natural choice for complex automation architectures because it significantly simplifies debugging of remote manufacturing sites by enabling advanced connectivity via remote VNC, Ethernet, GPIB, or a native GUI.

Features:

• All optical switches are available (independent of data rate and transmission format)
• Regardless of the switch size, the impact on the system's dynamic measurement range is minimized, with low losses for all configurations from 1x2 to 1x176
• The flexible SCPI remote interface enables users to program switches using MAP-200 style commands or maintain backward compatibility with the industry standard VIAVI SB/SC family of optical switches
• Ensures ultra-low 0.04dB PDL and ± 0.005dB repeatability, minimizes measurement uncertainty on single-input versions
• The new PTRIM option simplifies troubleshooting and can measure programmable rough losses of up to 20 dB of inline power on connected ports
• The 1C, 2D (duplex), and 2E input configurations implement a cost-saving architecture that reduces the number of switches required
• The expanded beam technology ensures that the multimode switch is "formally transparent" and does not interfere with the mode distribution, greatly simplifying transmission tests or tests with IEC standard mode startup

Application:

• Automation of test systems for multi-port components, modules and circuit boards
• Manage complex test sequence in manufacturing
• Used in conjunction with the MAP-200 mORL-A1 module to test multi-core connectors
• Long term reliability test

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