Agilent 4279A 1MHz C-V meter

The Agilent 4279A 1MHz C-V meter is the solution to improve measurement quality and throughput when it comes to measuring capacitance and bias voltage characteristics of semiconductors.The Agilent 4279A can measure capacitors in the range of 0.00001pF to 1280.00pF while scanning the DC bias voltage. The basic accuracy is 0.1% and the display resolution is 6 bits.Because the bias voltage uncertainty is so low, an internal programmable DC bias scan source with voltage accuracy of 0.1% ensures very few measurement errors in the +/-38V range.This makes Agilent 4279A an ideal tool for characterizing and testing varactor and MOS diodes.The measurement time is available in three optional modes: 10ms, 20ms and 30ms/ Meas for production efficiency.The Agilent 4279A's fast range selection and high-speed GP-IB data transfer capability can reduce test times.The automatic bias polarity control feature helps to quickly select the correct polarity bias voltage for the component under test.This new capability simplifies manual sampling tests in input/output checks and provides a simple polarity control method for automated test systems.

Main technical indicators

C-V measurements for wafer doping

C-V characterization and classification of varactor diodes.

Capacitance test for RF mixer and converter diodes.

Apply DC bias test capacitors that pass incoming inspection.

Measurement time: 10ms/20ms/30ms

Measuring accuracy: 0.1% (20ms)

Internal DC Bias: 0 to +/-38V, 0.1% programmable scan

Measuring range: 0.00001pF to 1280pF